Simple and robust method for determination of laser fluence thresholds for material modifications: an extension of Liu’s approach to imperfect beams

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  1. Mario Garcia-Lechuga ,  
  2. David Grojo
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Abstract

The so-called D-squared or Liu’s method is an extensively applied approach to determine the irradiation fluence thresholds for laser-induced damage or modification of materials. However, one of the assumptions behind the method is the use of an ideal spatial Gaussian beam that can lead in practice to significant errors depending on beam imperfections. In this work, we rigorously calculate the bias corrections required when applying the same method to Airy-disk like profiles. Those profiles are readily produced from any beam by insertion of an aperture in the optical path. Thus, the correction method gives a robust solution for exact threshold determination without any added technical complications as for instance advanced control or metrology of the beam. Illustrated by two case-studies, the approach holds potential to solve the strong discrepancies existing between the laser-induced damage thresholds reported in the literature. It provides also an appropriate tool for new studies with the most extreme laser radiations.

Corresponding author
Mario Garcia-Lechuga
0000-0002-9642-2982
Grant information

This project has received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation programme (grant agreement No [724480]), (project EXSEED).

Copyright
© 2021 Mario Garcia-Lechuga (Corresponding Author, Co-Author); David Grojo (Co-Author) Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

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Amendment

This version contains minor corrections addressing the comments from the reviewers together with some additional clarifications. We have made in particular two changes on the terminology. First, we have replaced the term “Integrated Spatial Distribution (ISD)” by the most commonly used formulation “Effective Beam Area (EBA)”. A second source of confusion in previous version was a concept appearing under two different terms (“energy fitting limits” and “maximum energy considered”). In this new version, this is now everywhere referred as “maximum considered energy”. This modification appears also on the new x-axis label of figures 3(a) and 3(b). Looking to other figure modifications, we have introduced colour changes on Figure 2, following now the same colour ordering as in Figure 3. Section 5D has been expanded by including additional details on the precision aspect (error determination). Some recommendations to the good applicability of this methodology are also added in this section. Finally, we have introduced two new tables (table 3 and 4) where the correction factors plotted on figure 3 can be more easily read by users of this methodology.

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Authors & roles

Mario Garcia-Lechuga

Aix Marseille Université, CNRS, LP3, UMR7341, Marseille, 13288, France

Departamento de Física Aplicada, Universidad Autónoma de Madrid, Madrid, 28049, Spain

Roles
Corresponding Author, Co-Author, Conceptualization, Formal Analysis, Investigation, Validation, Writing – Original Draft Preparation, Writing – Review & Editing
0000-0002-9642-2982

David Grojo

Aix Marseille Université, CNRS, LP3, UMR7341, Marseille, 13288, France

Roles
Co-Author, Conceptualization, Formal Analysis, Funding Acquisition, Validation, Writing – Review & Editing
0000-0002-8189-3781

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